The tool is very friendly, simple to use and works better than anything else in its category.Comparison of X-ray photoelectron spectroscopy, secondary ion mass spectrometry, electrospray ionization, and infrared spectroscopy analysis of GaAs capping layers.
The composition of the top layer of GaAs:Ga/GaAs/GaAs eutectic stacks, grown by the molecular beam epitaxy method, is studied by different methods: X 6add127376 farbro
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